SDD 2006 - Call for Papers

PRELIMINARY CALL FOR PAPERS

Scope and Mission -- Author Information -- Committees

Scope and Mission

Troubleshooting how and why circuits and systems fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, debugging the design function, failure mode learning for R&D, or just getting a working first prototype. But the detective work can become tricky. Sources of difficulty include circuit complexity, packaging, physical access, shortened product creation cycle, the traditional focus on just pass/fail testing, and missing tool and equipment capabilities. New and efficient solutions for debug and diagnosis will have a much needed and highly visible impact on productivity. The mission and objective of the SDD06 Workshop is to consider all issues related to debug and diagnosis of circuits and systems - from prototype bring-up to volume production.

The topics of interest include, but are not limited to, the following:

Debug Techniques and Methodologies
Structured Debug Architectures
Infrastructure IP for SDD
Design/Synthesis for Debug
Microprocessor Debug
Debug for FPGAs
Reuse of DFT for Debug and Diagnosis
Debug of Embedded Cores/SoCs
Digital/analog Turn-on
Methods & Tools
System Level Debug & Diagnosis
Equipment Impact and Techniques
Manufacturing & Prototype Environment
Silicon Debug Standardization
Case Studies

Author Information

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The workshop objective is to facilitate a valuable interactive information exchange. Both extended abstracts and full papers are acceptable for submission. Proposals that describe open issues, industry/technology needs or opinions are also welcome.

Length Guideline: 3 to 8 pages
Submissions due: August 1st
Acceptance Notification: September 1st
Final papers for inclusion into informal proceedings: September 22nd

Proposals for discussion panels and other special sessions are also invited. Please submit a 1 page abstract for these to the web site or contact the Program/Special-Session Chairs.

Authors of best paper submissions will be invited to contribute to an IET Proceedings Special Issue focused on Silicon Debug & Diagnosis.

For general information contact:

Mike Ricchetti - General Chair
ATI Research, Inc.
62 Forest Street
Marlboro, MA 01752-3028
Phone: (508) 486-1118
email: mricchetti@ati.com

For submission & program information contact:

Fidel Muradali - Program Chair
National Semiconductor
2900 Semiconductor Drive
Santa Clara, CA 95051
Phone: (408) 721-3246
email: fidel.muradali@nsc.com

Committees

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General Chair:
M. Ricchetti - ATI Research, Inc.

Program Chair:
F. Muradali - National Semi.

Special Sessions:
B. Vermeulen - Philips

Finance:
R. Chandramouli - ARM

Local Arrangement Chair:
I. Hartanto - Xilinx

Electronic Media:
I. Bayraktaroglu - Sun

Program Committee:
M. Abramovici - DAFCA
D. Appello - ST Microelectronics
C. Boit - TU Berlin
D. Burek - Magma
W-T Cheng - Mentor Graphics
J-L Carbonero - STMicroelectronics
B. Cory - nVidia
A. Crouch - Inovys
J. Figueras - U. Barcelona
D. Gizopoulos - U. Piraeus
K. Hatayama - STARC
Y.-C. Hsu - Novas
A. Ivanov - UBC
D. Josephson - Intel
R. Kapur - Synopsys
H. Kerkhoff - U. Twente
C. Landrault - LIRMM
T. McLaurin - ARM
C. Metra - U. Bologna
R. Molyneaux - Sun Microsystems
N. Nicolici - McMaster U.
Y. Okuda - Sony
A. Orailoglu - UCSD
P. Prinetto - Poli. Di Torino
M. Renovell - LIRMM
M.S. Reorda - Poli. Di Torino
G. Roberts - McGill U.
N. Stollon - First Silicon Solutions
C. Sul - Silicon Image
J. Tyzer - U. Poznan
S. Venkataraman - Intel
B. West - Credence
H. Wienrich - National Semi.

Steering Committee:
R. Aitken - ARM
F. Muradali - National Semi.
E. J. Marinissen - Philips
M. Ricchetti - ATI (Chair)
T. W. Williams - Synopsys
Y. Zorian - Virage Logic

For more information, visit us on the web at: http://evia.ucsd.edu/conferences/sdd/06/index.html

The 3rd IEEE International Workshop on Silicon Debug and Diagnosis (SDD06) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).